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- NIST/ITL StRD
- Dataset Name: SiRstv (SiRstv.dat)
- File Format: ASCII
- Certified Values (lines 41 to 47)
- Data (lines 61 to 85)
- Procedure: Analysis of Variance
- Reference: Ehrstein, James and Croarkin, M. Carroll.
- Unpublished NIST dataset.
- Data: 1 Factor
- 5 Treatments
- 5 Replicates/Cell
- 25 Observations
- 3 Constant Leading Digits
- Lower Level of Difficulty
- Observed Data
- Model: 6 Parameters (mu,tau_1, ... , tau_5)
- y_{ij} = mu + tau_i + epsilon_{ij}
- Certified Values:
- Source of Sums of Mean
- Variation df Squares Squares F Statistic
- Between Instrument 4 5.11462616000000E-02 1.27865654000000E-02 1.18046237440255E+00
- Within Instrument 20 2.16636560000000E-01 1.08318280000000E-02
- Certified R-Squared 1.90999039051129E-01
- Certified Residual
- Standard Deviation 1.04076068334656E-01
- Data: Instrument Resistance
- 1 196.3052
- 1 196.1240
- 1 196.1890
- 1 196.2569
- 1 196.3403
- 2 196.3042
- 2 196.3825
- 2 196.1669
- 2 196.3257
- 2 196.0422
- 3 196.1303
- 3 196.2005
- 3 196.2889
- 3 196.0343
- 3 196.1811
- 4 196.2795
- 4 196.1748
- 4 196.1494
- 4 196.1485
- 4 195.9885
- 5 196.2119
- 5 196.1051
- 5 196.1850
- 5 196.0052
- 5 196.2090
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